FTRTFT
2000
Springer
14 years 3 months ago
2000
Springer
Formal methods can improve the development of systems with high quality requirements, since they usually o er a precise, nonambiguous speci cation language and allow rigorous veri ...
MTDT
2003
IEEE
14 years 4 months ago
2003
IEEE
Abstract: The high complexity of the faulty behavior observed in DRAMs is caused primarily by the presence of internal floating nodes in defective DRAMs. This paper describes a ne...
ATS
2005
IEEE
14 years 5 months ago
2005
IEEE
Abstract: Fabrication process improvements and technology scaling results in modifications in the characteristics and in the behavior of manufactured memory chips, which also modi...
DATE
2006
IEEE
14 years 5 months ago
2006
IEEE
Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of faul...