Space of DRAM fault models and corresponding testing

Abstract: DRAMs play an important role in the semiconductor industry, due to their highly dense layout and their low price per bit. This paper presents the first framework of fault models specifically designed to describe the faulty behavior of DRAMs. The fault models in this paper are the outcome of a close collaboration with the industry, and are validated using a detailed Spice-based analysis of the faulty behavior of real DRAMs. The resulting fault space is then used to derive a couple of new DRAM-specific tests, needed to detect some of the faults in practice.

• Type: Conference
• Year: 2006
• Where: DATE
• Authors: Zaid Al-Ars, Said Hamdioui, A. J. van de Goor
• Keywords: DATE 2006, Fault Models, Faulty Behavior, Hardware, Real Drams