ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Abstract— The continuing divergence of processor and memory speeds has led to the increasing reliance on larger caches which have become major consumers of area and power in embe...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Circuit activity is a function of input patterns. When circuit activity changes abruptly, it can cause sudden drop or rise in power supply voltage. This change is known as power d...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
The placement of on-die decoupling capacitors (decap) between the power and ground supply grids has become a common practice in high performance processor designs. In this paper, ...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— Accurate estimation of worst-case crosstalk effects is critical for a realistic estimation of the worst-case behavior of deep sub-micron circuits. Crosstalk analysis models usu...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Abstract— Capacitive and inductive crosstalk noises are expected to be more serious in advanced technologies. However, capacitive and inductive crosstalk noises in the future hav...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— L1 data caches in high-performance processors continue to grow in set associativity. Higher associativity can significantly increase the cache energy consumption. Cache access...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— Microprocessors can have design errors that escape the test and validation process. The cost to rectify these errors after shipping the processors can be very expensive as it m...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
— A reduced complexity LDPC decoding method is presented that dramatically reduces wire interconnect complexity, which is a major issue in LDPC decoders. The proposed Split-Row m...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
—Soft error rates are an increasing problem in modern VLSI circuits. Commonly used error correcting codes reduce soft error rates in large memories and second level caches but ar...
ICCD
2006
IEEE
14 years 9 months ago
2006
IEEE
Abstract— Gate leakage (direct tunneling current for sub65nm CMOS) can severely affect both the transient and steady state behaviors of CMOS circuits. In this paper we quantify t...