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FCCM
2005
IEEE
123views VLSI» more  FCCM 2005»
14 years 2 months ago
A Novel 2D Filter Design Methodology for Heterogeneous Devices
In many image processing applications, fast convolution of an image with a large 2D filter is required. Field Programable Gate Arrays (FPGAs) are often used to achieve this goal ...
Christos-Savvas Bouganis, George A. Constantinides...
FCCM
2005
IEEE
106views VLSI» more  FCCM 2005»
14 years 2 months ago
The Erlangen Slot Machine: A Highly Flexible FPGA-Based Reconfigurable Platform
Christophe Bobda, Mateusz Majer, Ali Ahmadinia, Th...
FCCM
2005
IEEE
155views VLSI» more  FCCM 2005»
14 years 2 months ago
An Open TCP/IP Core for Reconfigurable Logic
Apostolos Dollas, Ioannis Ermis, Iosif Koidis, Ioa...
FCCM
2005
IEEE
89views VLSI» more  FCCM 2005»
14 years 2 months ago
A General Purpose, Highly Efficient Communication Controller Architecture for Hardware Acceleration Platforms
Although researchers have presented individual techniques to efficiently utilize the Peripheral Component Interconnect (PCI) bus, their contributions fail to provide a direct path...
Petersen F. Curt, James P. Durbano, Fernando E. Or...
FCCM
2005
IEEE
96views VLSI» more  FCCM 2005»
14 years 2 months ago
A Framework for Rule Processing in Reconfigurable Network Systems
Michael Attig, John W. Lockwood
FCCM
2005
IEEE
151views VLSI» more  FCCM 2005»
14 years 2 months ago
Accelerating Applications by Mapping Critical Kernels on Coarse-Grain Reconfigurable Hardware in Hybrid Systems
In this paper, we propose a method for speeding-up applications by partitioning them between the reconfigurable hardware blocks of different granularity and mapping critical parts...
Michalis D. Galanis, Grigoris Dimitroulakos, Costa...
EH
2005
IEEE
158views Hardware» more  EH 2005»
14 years 2 months ago
Co-evolutionary Variance Can Guide Physical Testing in Evolutionary System Identification
Co-evolution of system models and system tests can be used for exploratory system identification of physical platforms. Here we demonstrate how the amount of physical testing can ...
Viktor Zykov, Josh C. Bongard, Hod Lipson
EH
2005
IEEE
127views Hardware» more  EH 2005»
14 years 2 months ago
On the Robustness Achievable with Stochastic Development Processes
Manufacturing processes are a key source of faults in complex hardware systems. Minimizing this impact of manufacturing uncertainties is one way towards achieving fault tolerant s...
Shivakumar Viswanathan, Jordan B. Pollack