ATS
1996
IEEE
14 years 3 months ago
1996
IEEE
A hierarchical test generation method is presented that uses the inherent hierarchical structure of the circuit under test and takes fault diagnosability into account right from t...
DATE
2000
IEEE
14 years 4 months ago
2000
IEEE
Higher levels of integration, the need for test re-use, and the mixed-signal nature of today’s SOC’s necessitate hierarchical test generation and system level test composition...