We consider the problem of testing for delay faults in macrobased circuits. Macro-based circuits are obtained as a result of technology mapping. Gate-level fault models cannot be ...
? We describe a synthesis system that takes operating range constraints and inter- and intra- circuit parametric manufacturing variations into account while designing a sized and b...
Tamal Mukherjee, L. Richard Carley, Rob A. Rutenba...
This work presents techniques for computing the switching activities of all circuit nodes under pseudorandom or biased input sequences and assuming a zero delay mode of operation....
For a logic design with level-sensitive latches, we need to validate timing signal paths which may flush through several latches. We developed efficient algorithms based on the mo...
-- We describe a new high-level compiler called Integral fordesigning system interface modules. The inputis a high-levelconcurrent algorithmic specification that can model complex ...
We study a new placement problem: the reproducing placement problem (RPP). In each phase a module (or gate) is decomposed into two (or more) simpler modules. The goal is nd a \go...
In this paper we present a power dissipation model considering the charging/discharging of capacitance at the gate output node as well as internal nodes, and capacitance feedthrou...