ICCAD 1998 | Sciweavers

32

ICCAD
1998
IEEE

122views Hardware» more ICCAD 1998»

Dynamic fault collapsing and diagnostic test pattern generation for sequential circuits

14 years 3 months ago

In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by de...

Vamsi Boppana, W. Kent Fuchs

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19

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ICCAD
1998
IEEE

71views Hardware» more ICCAD 1998»

Dynamic power management of electronic systems

14 years 3 months ago

Download si2.epfl.ch

Luca Benini, Alessandro Bogliolo, Giovanni De Mich...

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15

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ICCAD
1998
IEEE

87views Hardware» more ICCAD 1998»

Gate-size selection for standard cell libraries

14 years 3 months ago

Download www.cad.t.u-tokyo.ac.jp

Frederik Beeftink, Prabhakar Kudva, David S. Kung,...

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