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    VLSID
    2006
    IEEE
    129views VLSI» more  VLSID 2006»
    A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
    14 years 12 months ago
    A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity
    Download  www.cambr.uidaho.edu
    With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a ...
    Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasma...
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