A Stimulus-Free Probabilistic Model for Single-Event-Upset Sensitivity

With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a growing concern in logic circuits. Accurate understanding and estimation of Single-EventUpset sensitivities of individual nodes is necessary to achieve better soft error hardening techniques at logic sign abstraction. We propose a probabilistic framework to the study the effect of inputs, circuits structure and delay on Single-Event-Upset sensitivity of nodes in logic circuits as a single joint probability distribution function (pdf). To model the effect of timing, we consider signals at their possible arrival times as the random variables of interest. The underlying joint probability distribution function, consists of two components: ideal random variables without the effect of SEU and the random variables affected by the SEU. We use a Bayesian Network to represent the joint pdf which is a minimal compact di...

• Type: Conference
• Year: 2006
• Where: VLSID
• Authors: Mohammad Gh. Mohammad, Laila Terkawi, Muna Albasman
• Keywords: Computer Architecture, Ideal Random Variables, Joint Probability Distribution, Random Variables, VLSID 2006