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    VLSID
    2003
    IEEE
    114views VLSI» more  VLSID 2003»
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    14 years 11 months ago
    Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
    Download  www.essderc2002.deis.unibo.it
    Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface ...
    S. Mahapatra, S. Shukuri, Jeff Bude
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