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VLSID
2003
IEEE

Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs

14 years 12 months ago
Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs
Cycling induced performance degradation of flash EEPROMs has been reported for VB=0 and VB<0 programming operation. Compared to VB=0, VB<0 programming shows lower interface degradation for identical cumulative charge fluence (for program) during repetitive program/erase cycling. Reduction in programming gate current has been found to be lower for VB<0 operation under identical interface damage as the VB=0 case. As a consequence, programming under VB<0 condition has been found to cause lower degradation of programming time and programmed VT due to cycling.
S. Mahapatra, S. Shukuri, Jeff Bude
Added 01 Dec 2009
Updated 01 Dec 2009
Type Conference
Year 2003
Where VLSID
Authors S. Mahapatra, S. Shukuri, Jeff Bude
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