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2008
IEEE
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14 years 6 months ago
A Statistical Approach to Characterizing and Testing Functionalized Nanowires
Unlike the top-down photolithographic CMOS VLSI process, cost-effective bulk fabrication of nanodevices calls for a bottom-up approach, generally called self-assembly. Selfassembl...
James Dardig, Haralampos-G. D. Stratigopoulos, Eri...