ASPLOS
2008
ACM
14 years 2 months ago
2008
ACM
Future multicore processors will be more susceptible to a variety of hardware failures. In particular, intermittent faults, caused in part by manufacturing, thermal, and voltage v...
DATE
2006
IEEE
14 years 6 months ago
2006
IEEE
Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...