ATS
2004
IEEE
14 years 3 months ago
2004
IEEE
Conventional serial connection of internal scan chains brings the power and time penalty. A novel parallel core wrapper design (pCWD) approach is presented in this paper for reduc...
VLSID
2005
IEEE
14 years 12 months ago
2005
IEEE
Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...