ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-Â...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
This paper proposes a new clocking strategy for dynamic circuit. It provides faster performance and smaller area than conventional clocking scheme. The proposed clocking scheme fo...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
Mind-boggling complexity of EDA tools necessitates reuse of intellectual property in any large-scale commercial or academic operation. However, due to the nature of software, a to...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
Approach Abstracts AltPSM Lithography Requirements for sub-100nm IC Design Domains Pradiptya Ghosh, Chung-shin Kang, Michael Sanie and David Pinto Numerical Technologies, 70 West P...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
An algorithm for mapping core terminals to System-On-a-Chip (SOC) I/O pins and scheduling tests in order to achieve costefficient concurrent test for core-based designs is present...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
- This paper investigates important problems involved in the design of a CML buffer as well as a chain of tapered CML buffers. A new design procedure to systematically design a cha...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
We discuss a non-intrusive methodology for concurrent fault detection in random combinational logic. The proposed method is similar to duplication, wherein a replica of the circui...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
Scan chain insertion can have large impact on routability, wirelength and timing. We propose a routing-driven and timing-aware methodology for scan insertion with minimum wireleng...
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
ISQED
2003
IEEE
14 years 5 months ago
2003
IEEE
The nature of IC design has is necessarily evolving to a more data-centric design flow in which EDA tools share a common information in a design database without the negative cost...