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102
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ICCAD
2005
IEEE
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ICCAD 2005
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Statistical technology mapping for parametric yield
15 years 11 months ago
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www.cerc.utexas.edu
The increasing variability of process parameters leads to substantial parametric yield losses due to timing and leakage power constraints. Leakage power is especially affected by ...
Ashish Kumar Singh, Murari Mani, Michael Orshansky
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