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    3DIC
    2009
    IEEE
    258views Hardware» more  3DIC 2009»
    A capacitive coupling interface with high sensitivity for wireless wafer testing
    14 years 7 months ago
    A capacitive coupling interface with high sensitivity for wireless wafer testing
    Download  icdesign.iis.u-tokyo.ac.jp
    —A high-sensitivity capacitive-coupling interface is presented for wireless wafer testing systems. The transmitter is a buffer that drives the transmitter pad, and the receiver c...
    Gil-Su Kim, Makoto Takamiya, Takayasu Sakurai
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