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27
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MJ
2006
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MJ 2006
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Novel gate and substrate triggering techniques for deep sub-micron ESD protection devices
13 years 10 months ago
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www.ece.uwaterloo.ca
As technology feature size is reduced, ESD becomes the dominant failure mode due to lower gate oxide breakdown voltage. In this paper, the effectiveness of new gate and substrate ...
Oleg Semenov, H. Sarbishaei, Valery Axelrad, Manoj...
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