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MR 2006
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ESD robustness of thin-film devices with different layout structures in LTPS technology
15 years 3 months ago
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www.ics.ee.nctu.edu.tw
The electrostatic discharge (ESD) robustness of different thin-film devices, including three diodes and two thin-film transistors (TFTs) in low-temperature polysilicon (LTPS) tech...
Chih-Kang Deng, Ming-Dou Ker
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