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ATS
2003
IEEE
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ATS 2003
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March SL: A Test For All Static Linked Memory Faults
14 years 5 months ago
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ce.et.tudelft.nl
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mik...
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