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ATS
2003
IEEE
87views Hardware» more  ATS 2003»
14 years 5 months ago
March SL: A Test For All Static Linked Memory Faults
The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all ...
Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mik...