March SL: A Test For All Static Linked Memory Faults

The analysis of linked faults has proven to be a source for new memory tests, characterized by an increased fault coverage. The paper gives a set of five new tests to target all possible linked faults. The tests are merged into a single test, March SL, detecting all faults in the linked fault space. The preliminary test results of an experiment done at Intel will be reported; they show that March SL scores high and detects some unique faults. Key words: Memory testing, linked faults, functional fault models, march tests, fault coverage.

• Type: Conference
• Year: 2003
• Where: ATS
• Authors: Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers
• Keywords: ATS 2003, Fault Coverage, Hardware, March SL, Possible Linked Faults