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    ETS
    2009
    IEEE
    99views Hardware» more  ETS 2009»
    On Minimization of Peak Power for Scan Circuit during Test
    13 years 10 months ago
    On Minimization of Peak Power for Scan Circuit during Test
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    Scan circuit generally causes excessive switching activity compared to normal circuit operation. The higher switching activity in turn causes higher peak power supply current whic...
    Jaynarayan T. Tudu, Erik Larsson, Virendra Singh, ...
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