MICRO
2006
IEEE
14 years 12 days ago
2006
IEEE
Shrinking devices to the nanoscale, increasing integration densities, and reducing of voltage levels down to the thermal limit, all conspire to produce faulty systems. Frequent oc...
DATE
2006
IEEE
14 years 6 months ago
2006
IEEE
As devices are scaled to the nanoscale regime, it is clear that future nanodevices will be plagued by higher soft error rates and reduced noise margins. Traditional implementation...