VTS
2007
IEEE
14 years 5 months ago
2007
IEEE
Conventional error correcting code (ECC) schemes used in memories and caches cannot correct double bit errors caused by a single event upset (SEU). As memory density increases, mu...
DAC
2008
ACM
15 years 13 days ago
2008
ACM
1 Soft errors induced by radiation are an increasing problem in the microelectronic field. Although traditional models estimate the reliability of memories suffering Single Event U...