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GLVLSI
2010
IEEE

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Reliability analysis of power gated SRAM under combined effects of NBTI and PBTI in nano-scale CMOS

14 years 1 months ago

Transistor aging effects (NBTI and PBTI) impact the reliability of SRAM in nano-scale CMOS technologies. In this research, the combined effect of NBTI and PBTI on power gated SRAM...

Anuj Pushkarna, Hamid Mahmoodi

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