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34
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ISCA
2010
IEEE
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ISCA 2010
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Use ECP, not ECC, for hard failures in resistive memories
14 years 3 months ago
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research.microsoft.com
As leakage and other charge storage limitations begin to impair the scalability of DRAM, non-volatile resistive memories are being developed as a potential replacement. Unfortunat...
Stuart E. Schechter, Gabriel H. Loh, Karin Straus,...
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