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    DATE
    2006
    IEEE
    115views Hardware» more  DATE 2006»
    Optimal periodic testing of intermittent faults in embedded pipelined processor applications
    14 years 5 months ago
    Optimal periodic testing of intermittent faults in embedded pipelined processor applications
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    Today’s nanometer technology trends have a very negative impact on the reliability of semiconductor products. Intermittent faults constitute the largest part of reliability fail...
    Nektarios Kranitis, Andreas Merentitis, N. Laoutar...
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