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    IEEE
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    Pseudo-Functional Scan-based BIST for Delay Fault
    14 years 6 months ago
    Pseudo-Functional Scan-based BIST for Delay Fault
    Download  cadlab.ece.ucsb.edu
    This paper presents a pseudo-functional BIST scheme that attempts to minimize the over-testing problem of logic BIST for delay and crosstalk-induced failures. The over-testing pro...
    Yung-Chieh Lin, Feng Lu, Kwang-Ting Cheng
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