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DATE
2005
IEEE
128views Hardware» more  DATE 2005»
14 years 5 months ago
Modeling Interconnect Variability Using Efficient Parametric Model Order Reduction
Assessing IC manufacturing process fluctuations and their impacts on IC interconnect performance has become unavoidable for modern DSM designs. However, the construction of parame...
Peng Li, Frank Liu, Xin Li, Lawrence T. Pileggi, S...