DAC
2005
ACM
13 years 9 months ago
2005
ACM
This paper presents a new Green function-based approach for substrate parasitic extraction in substrates with inhomogeneous layers. This new formulation allows analysis of noise c...
ASPDAC
2007
ACM
13 years 11 months ago
2007
ACM
Abstract-- Due to photo-lithography effects and manufacture process variations, the actual features fabricated on the wafer are different from the designed ones. This difference ca...
HIPC
2004
Springer
14 years 11 days ago
2004
Springer
Parasitic extraction techniques are used to estimate signal delay in VLSI chips. Inductance extraction is a critical component of the parasitic extraction process in which on-chip ...