DAC
2005
ACM
14 years 2 months ago
2005
ACM
This paper presents a new Green function-based approach for substrate parasitic extraction in substrates with inhomogeneous layers. This new formulation allows analysis of noise c...
ASPDAC
2007
ACM
14 years 4 months ago
2007
ACM
Abstract-- Due to photo-lithography effects and manufacture process variations, the actual features fabricated on the wafer are different from the designed ones. This difference ca...
HIPC
2004
Springer
14 years 5 months ago
2004
Springer
Parasitic extraction techniques are used to estimate signal delay in VLSI chips. Inductance extraction is a critical component of the parasitic extraction process in which on-chip ...