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ICCAD
2002
IEEE
85views Hardware» more  ICCAD 2002»
14 years 3 months ago
On undetectable faults in partial scan circuits
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
Irith Pomeranz, Sudhakar M. Reddy