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ICCAD
2002
IEEE
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ICCAD 2002
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On undetectable faults in partial scan circuits
14 years 4 months ago
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iccd.et.tudelft.nl
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive tes...
Irith Pomeranz, Sudhakar M. Reddy
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