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ICCAD
2002
IEEE

On undetectable faults in partial scan circuits

14 years 4 months ago
On undetectable faults in partial scan circuits
We study the undetectable faults in partial scan circuits under a test application scheme referred to as transparent-scan. The transparent-scan approach allows very aggressive test compaction compared to other approaches. We demonstrate that, unlike other approaches that provide high levels of test compaction for partial scan circuits, this approach does not increase the number of undetectable faults. We also discuss the monotonicity of the number of undetectable faults with increased levels of scan.
Irith Pomeranz, Sudhakar M. Reddy
Added 14 Jul 2010
Updated 14 Jul 2010
Type Conference
Year 2002
Where ICCAD
Authors Irith Pomeranz, Sudhakar M. Reddy
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