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ICCAD
2008
IEEE
129views Hardware» more  ICCAD 2008»
14 years 6 months ago
Path-RO: a novel on-chip critical path delay measurement under process variations
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Dat...