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29
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ICCAD
2008
IEEE
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ICCAD 2008
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Path-RO: a novel on-chip critical path delay measurement under process variations
14 years 6 months ago
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www.cecs.uci.edu
— As technology scales to 45nm and below, process variations will present significant impact on path delay. This trend makes the deviation between simulated path delay and actua...
Xiaoxiao Wang, Mohammad Tehranipoor, Ramyanshu Dat...
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