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30
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ASPDAC
2009
ACM
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ASPDAC 2009
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Adaptive techniques for overcoming performance degradation due to aging in digital circuits
14 years 6 months ago
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www.ece.umn.edu
— Negative Bias Temperature Instability (NBTI) in PMOS transistors has become a major reliability concern in present-day digital circuit design. Further, with the recent usage of...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...
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