DFT
2002
IEEE
14 years 4 months ago
2002
IEEE
A novel approach for reducing power consumption in checkers used for concurrent error detection is presented. Spatial correlations between the outputs of the circuit that drives t...
DATE
2003
IEEE
14 years 4 months ago
2003
IEEE
We propose a new approach to test generation and test compaction for scan circuits that eliminates the distinction between scan operations and application of primary input vectors...