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    ICCAD
    2004
    IEEE
    97views Hardware» more  ICCAD 2004»
    Statistical design and optimization of SRAM cell for yield enhancement
    14 years 8 months ago
    Statistical design and optimization of SRAM cell for yield enhancement
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    In this paper, we have analyzed ond modeled the fiilure probabilities ofSRAM cells due to process parameter variations. A method to predict the yield of a memoiy chip based on the...
    Saibal Mukhopadhyay, Hamid Mahmoodi-Meimand, Kaush...
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