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ASPDAC
2000
ACM
96views Hardware» more  ASPDAC 2000»
14 years 3 months ago
A programmable built-in self-test core for embedded memories
Testing embedded memories is becoming an industry-wide concern with the advent of deep-submicron technology and system-on-chip applications. We present a prototype chip for a progr...
Chih-Tsun Huang, Jing-Reng Huang, Cheng-Wen Wu