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ATS
2000
IEEE
149views Hardware» more  ATS 2000»
14 years 3 months ago
Efficient built-in self-test algorithm for memory
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are...
Sying-Jyan Wang, Chen-Jung Wei