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ATS
2000
IEEE

Efficient built-in self-test algorithm for memory

14 years 3 months ago
Efficient built-in self-test algorithm for memory
We present a new pseudorandom testing algorithm for the Built-In Self-Test (BIST) of DRAM. In this algorithm, test patterns are complemented to generate state-transitions that are needed for the detection of coulping faults. As a result, the number of test patterns required is less than half of the traditional method, while the extra hardware is negligible.
Sying-Jyan Wang, Chen-Jung Wei
Added 30 Jul 2010
Updated 30 Jul 2010
Type Conference
Year 2000
Where ATS
Authors Sying-Jyan Wang, Chen-Jung Wei
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