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35
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ISQED
2010
IEEE
128
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ISQED 2010
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Soft error rate determination for nanoscale sequential logic
14 years 5 months ago
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www.eng.auburn.edu
We analyze the neutron induced soft error rate (SER) by modeling induced error pulse using two parameters, occurrence frequency and probability density function for the pulse widt...
Fan Wang, Vishwani D. Agrawal
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