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37
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VLSID
2002
IEEE
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VLSI
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VLSID 2002
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Design of an On-Chip Test Pattern Generator without Prohibited Pattern Set (PPS)
14 years 11 months ago
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www.cs.york.ac.uk
| This paper reports the design of a Test Pattern Generator (TPG) for VLSI circuits. The onchip TPG is so designed that it generates test patterns while avoiding generation of a gi...
Niloy Ganguly, Biplab K. Sikdar, Parimal Pal Chaud...
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