ISQED
2005
IEEE
14 years 5 months ago
2005
IEEE
The purpose of the paper is to introduce a new failure rate-based methodology for reliability simulation of deep submicron CMOS integrated circuits. Firstly, two of the state-of-t...
DAC
2006
ACM
15 years 16 days ago
2006
ACM
Recent progress in EDA tools allows IC designs to be accurately verified with consequent improvements in yield and performance through reduced guard bands. This paper will present...