VTS
1996
IEEE
14 years 3 months ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
VTS
2005
IEEE
14 years 5 months ago
2005
IEEE
We present three resistive bridging fault models valid for different CMOS technologies. The models are partitioned into a general framework (which is shared by all three models) a...
DATE
2008
IEEE
14 years 6 months ago
2008
IEEE
We report the successful application of a resistive bridging fault (RBF) simulator to industrial benchmark circuits. Despite the slowdown due to the consideration of the sophistic...