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    VLSID
    2005
    IEEE
    131views VLSI» more  VLSID 2005»
    Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
    14 years 12 months ago
    Efficient Space/Time Compression to Reduce Test Data Volume and Testing Time for IP Cores
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    Abstract-- We present two-dimensional (space/time) compression techniques that reduce test data volume and test application time for scan testing of intellectual property (IP) core...
    Lei Li, Krishnendu Chakrabarty, Seiji Kajihara, Sh...
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