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    ISLPED
    2005
    ACM
    68views Hardware» more  ISLPED 2005»
    Two efficient methods to reduce power and testing time
    14 years 5 months ago
    Two efficient methods to reduce power and testing time
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    Reducing power dissipation and testing time is accomplished by forming two clusters of don’t-care bit inside an input and a response test cube. New reordering scheme of scan lat...
    Il-soo Lee, Tony Ambler
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