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ITC
1992
IEEE
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14 years 4 months ago
ScanBIST: A Multi-frequency Scan-based BIST Method
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing...
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hass...