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ITC
1992
IEEE

ScanBIST: A Multi-frequency Scan-based BIST Method

14 years 3 months ago
ScanBIST: A Multi-frequency Scan-based BIST Method
This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing of scannable circuits. A few new design rules and small modifications to the existing ATPG were necessary to implementthe technique.
Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hass
Added 10 Aug 2010
Updated 10 Aug 2010
Type Conference
Year 1992
Where ITC
Authors Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
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