ScanBIST: A Multi-frequency Scan-based BIST Method

This paper presents a BIST technique that allows the synchronization of multiple scan chains clocked at different frequencies. The technique is used to improve performance testing of scannable circuits. A few new design rules and small modifications to the existing ATPG were necessary to implementthe technique.

• Type: Conference
• Year: 1992
• Where: ITC
• Authors: Benoit Nadeau-Dostie, Dwayne Burek, Abu S. M. Hassan
• Keywords: BIST Technique, Hardware, ITC 1992, Multiple Scan Chains, Scannable Circuits