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    GLVLSI
    2009
    IEEE
    112views VLSI» more  GLVLSI 2009»
    The effect of design parameters on single-event upset sensitivity of MOS current mode logic
    14 years 7 months ago
    The effect of design parameters on single-event upset sensitivity of MOS current mode logic
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    In this paper, we describe and discuss the effects of design parameters such as transistor size, output voltage swing and bias current on radiation sensitivity of MOS current mode...
    Mahta Haghi, Jeff Draper
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