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ITC
1998
IEEE
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ITC 1998
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Test generation in VLSI circuits for crosstalk noise
14 years 4 months ago
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www.itcprogramdev.org
This paper addresses the problem of efficiently and accurately generating two-vector tests for crosstalk induced effects, such as pulses, signal speedup and slowdown, in digital c...
Weiyu Chen, Sandeep K. Gupta, Melvin A. Breuer
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